发明名称 Low resistance polysilicon strap
摘要 A low resistance polysilicon (poly) structure includes a first poly coupled to a substrate and having a sidewall. A second poly is separated from the sidewall of the first poly and the substrate by a programming oxide. The first poly and the second poly have substantially a same planarized height above the substrate. The first poly extends from a device region to a strap region, and extends substantially parallel to a first length of the second poly. A second length of the second poly extends away from the first poly in the strap region and includes a salicide. A first diffusion region crosses the first poly and the second poly in the device region. A masked width of the first length of the second poly is defined by an etched spacer. A low resistance contact is coupled to the second length of the second poly in the strap region.
申请公布号 US9236498(B1) 申请公布日期 2016.01.12
申请号 US201414470894 申请日期 2014.08.27
申请人 Freescale Semiconductor, Inc. 发明人 Roy Anirban;Swift Craig T.
分类号 H01L27/115;H01L29/792;H01L29/66 主分类号 H01L27/115
代理机构 Atesa Legal LLC 代理人 Atesa Legal LLC
主权项 1. A method for manufacturing a low resistance polysilicon (poly) strap comprising: fabricating a structure including a programming oxide separating a first poly from a second poly, the second poly separating the programming oxide from an insulator, the first poly extending from a device region to a strap region, the first poly extending substantially parallel to a first length of the second poly, a second length of the second poly extending away from the first poly in the strap region, and a first diffusion region crossing the first poly and the second poly in the device region; etching the insulator to form a spacer, the spacer defining a masked width of the first length of the second poly; etching the second poly excluded by the spacer in the device region to a first depth to leave the masked width of the first length of the second poly and etching the second poly excluded by a mask in the strap region to leave the second length of the second poly; forming a salicide on at least the second length of the second poly; planarizing the first poly and the second poly to a second depth by substantially removing the spacer; and forming a contact with the second length of the second poly in the strap region.
地址 Austin TX US