发明名称 Multilayer ceramic capacitor
摘要 A multilayer ceramic capacitor includes a ceramic laminated body including dielectric ceramic layers and internal electrodes stacked with the dielectric ceramic layers disposed therebetween. The dielectric ceramic layers contain a perovskite compound containing Ba and Ti, Zr, and a rare earth element, and ratios of Zr and the rare earth element to 100 molar parts of Ti are about 0.4 to 2.0 molar parts and about 0.05 to 0.5 molar parts, respectively. The molar ratio of Zr to the rare earth element is about 3.3 to about 8.0, and Al-containing segregated substances are present in about 80% or more of defective portions where continuity of the internal electrodes is interrupted. Dielectric ceramic constituting the dielectric ceramic layers has an average grain diameter of about 230 nm to about 350 nm.
申请公布号 US9236185(B1) 申请公布日期 2016.01.12
申请号 US201414530932 申请日期 2014.11.03
申请人 Murata Manufacturing Co., Ltd. 发明人 Oguni Toshimi
分类号 H01G4/06;H01G4/005;H01G4/30;C04B35/00;H01G4/12 主分类号 H01G4/06
代理机构 Keating & Bennett, LLP 代理人 Keating & Bennett, LLP
主权项 1. A multilayer ceramic capacitor comprising: a ceramic laminated body including dielectric ceramic layers and internal electrodes stacked with the dielectric ceramic layers disposed therebetween; and external electrodes disposed on a predetermined area of the ceramic laminated body so as to be electrically connected to respective ones of the internal electrodes; wherein the dielectric ceramic layers include a perovskite compound including Ba and Ti, Zr, and a rare earth element; ratios of Zr and the rare earth element to 100 molar parts of Ti are within a range of: Zr: about 0.4 molar parts to about 2.0 molar parts;the rare earth element: about 0.05 molar parts to about 0.5 molar parts, anda molar ratio (Zr/rare earth element) of Zr to the rare earth element is within a range of about 3.3 to about 8.0; the internal electrodes include defective portions interrupting continuity of the internal electrodes; a proportion P1 determined by a formula P1=N1/N2×100 is about 80% or more, where N1 represents a total number of the defective portions including Al therein, and N2 represents a total number of the defective portions; and dielectric ceramic included in the dielectric ceramic layers has an average grain diameter within a range of about 230 nm to about 350 nm.
地址 Kyoto JP