发明名称 Photoresist and Method of Manufacture
摘要 A system and method for anti-reflective layers is provided. In an embodiment the anti-reflective layer comprises a floating additive in order to form a floating additive region along a top surface of the anti-reflective layer after the anti-reflective layer has dispersed. The floating additive may comprise an additive group which will decompose along with a fluorine unit bonded to the additive group which will decompose. Additionally, adhesion between the middle layer and the photoresist may be increased by applying an adhesion promotion layer using either a deposition process or phase separation, or a cross-linking may be performed between the middle layer and the photoresist.
申请公布号 US2016005595(A1) 申请公布日期 2016.01.07
申请号 US201514849154 申请日期 2015.09.09
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Liu Chen-Yu;Chang Ching-Yu
分类号 H01L21/027;H01L21/308;H01L21/02 主分类号 H01L21/027
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, the method comprising: dispensing an anti-reflective material over a substrate to form an anti-reflective coating layer, the anti-reflective material having a first concentration of a floating additive, wherein the floating additive further comprises: a group to be decomposed; anda fluorine group bonded to the group to be decomposed; and forming a floating region adjacent to a top surface of the anti-reflective coating, the floating region having a second concentration of the floating additive greater than the first concentration.
地址 Hsin-Chu TW