发明名称 |
Photoresist and Method of Manufacture |
摘要 |
A system and method for anti-reflective layers is provided. In an embodiment the anti-reflective layer comprises a floating additive in order to form a floating additive region along a top surface of the anti-reflective layer after the anti-reflective layer has dispersed. The floating additive may comprise an additive group which will decompose along with a fluorine unit bonded to the additive group which will decompose. Additionally, adhesion between the middle layer and the photoresist may be increased by applying an adhesion promotion layer using either a deposition process or phase separation, or a cross-linking may be performed between the middle layer and the photoresist. |
申请公布号 |
US2016005595(A1) |
申请公布日期 |
2016.01.07 |
申请号 |
US201514849154 |
申请日期 |
2015.09.09 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Liu Chen-Yu;Chang Ching-Yu |
分类号 |
H01L21/027;H01L21/308;H01L21/02 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device, the method comprising:
dispensing an anti-reflective material over a substrate to form an anti-reflective coating layer, the anti-reflective material having a first concentration of a floating additive, wherein the floating additive further comprises:
a group to be decomposed; anda fluorine group bonded to the group to be decomposed; and forming a floating region adjacent to a top surface of the anti-reflective coating, the floating region having a second concentration of the floating additive greater than the first concentration. |
地址 |
Hsin-Chu TW |