发明名称 |
Capacitor and method of forming same |
摘要 |
A device comprises a substrate having at least one active region, an insulating layer above the substrate, and an electrode in a gate electrode layer above the insulating layer, forming a metal-oxide-semiconductor (MOS) capacitor. A first contact layer is provided on the electrode, having an elongated first pattern extending in a first direction parallel to the electrode. A contact structure contacts the substrate. The contact structure has an elongated second pattern extending parallel to the first pattern. A dielectric material is provided between the first and second patterns, so that the first and second patterns and dielectric material form a side-wall capacitor connected in parallel to the MOS capacitor. |
申请公布号 |
US9231048(B2) |
申请公布日期 |
2016.01.05 |
申请号 |
US201313929834 |
申请日期 |
2013.06.28 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
An Chi-Di;Chen Chien-Hung;Chan Yu-Juan |
分类号 |
H01L49/02;H01L29/66;H01L29/94;H01L23/522;H01L27/02 |
主分类号 |
H01L49/02 |
代理机构 |
Duane Morris LLP |
代理人 |
Duane Morris LLP |
主权项 |
1. A device, comprising:
a semiconductor substrate; a gate electrode layer above the semiconductor substrate; an interconnect structure above the gate electrode layer, the interconnect structure having one or more conductive pattern layers; and at least one side-wall capacitor including a contact layer having a portion abutting the gate electrode layer, the at least one side-wall capacitor extending no lower than a lowest portion of the gate electrode layer and extending no higher than a highest portion of the contact layer. |
地址 |
Hsin-Chu TW |