发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device has a semiconductor layer, a floating gate electrode provided over the semiconductor layer via a first insulation film, and an erase gate electrode to which an erase voltage is applied. The floating gate electrode has an opposing region that opposes via a second insulation film to the erase gate electrode. The opposing region has such a shape that multiple electric field concentrating portions are formed when the erase voltage is applied to the erase gate electrode.
申请公布号 US9219134(B2) 申请公布日期 2015.12.22
申请号 US201314067267 申请日期 2013.10.30
申请人 Renesas Electronics Corporation 发明人 Fukumoto Hideto
分类号 G11C11/34;H01L29/66;G11C16/04;H01L29/423;H01L29/788;H01L27/115 主分类号 G11C11/34
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A semiconductor device comprising: a semiconductor layer; a floating gate electrode provided over the semiconductor layer via a first insulation film; and an erase gate electrode to which an erase voltage is applied, wherein the floating gate electrode has an opposing region that opposes via a second insulation film to the erase gate electrode, and wherein the opposing region has such a shape that a plurality of electric field concentration portions are formed when the erase voltage is applied to the erase gate electrode, wherein a cross sectional shape of the floating gate electrode has a plurality of corners in the opposing region, and wherein a plurality of portions are formed to the erase gate electrode so as to conform to the plurality of corners.
地址 Kanagawa JP