发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which hardly malfunctions even in a steep variation in a power-supply voltage and has low power consumption. SOLUTION: The integrated circuit device 1 is operated with a difference between a VDD (first potential) supplied by a VDD supply line 60 (first potential supply line) and a VSS (second potential) supplied by a VSS supply line 70 (second potential supply line), as the power-supply voltage. The integrated circuit device 1 includes a constant voltage generation circuit 10 for generating a fixed constant voltage 12 based on the first and second potentials and a power-supply voltage variation detecting circuit 20 for detecting a variation having a prescribed width of the power-supply voltage. The constant voltage generation circuit 10 increases a current flowing to a differential stage circuit, for a prescribed period when the power-supply voltage variation detecting circuit 20 detects the variation in the power-supply voltage. The power-supply voltage variation detecting circuit 20 can include a power-supply voltage rise detecting circuit 30 for detecting a variation in the power-supply voltage in a rising direction and a power-supply voltage fall detecting circuit 40 for detecting a variation in the power-supply voltage in a falling direction. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009003764(A) 申请公布日期 2009.01.08
申请号 JP20070165098 申请日期 2007.06.22
申请人 SEIKO EPSON CORP 发明人 KADOWAKI TADAO
分类号 G05F1/56;H01L21/822;H01L27/04 主分类号 G05F1/56
代理机构 代理人
主权项
地址