发明名称 |
METHOD FOR CONTACTLESS MEASUREMENT OF SURFACE ROUGHNESS PARAMETRES |
摘要 |
FIELD: physics. ^ SUBSTANCE: maximum dimension L of a spot on the measured surface is given. A beam of probe radiation is directed on the spot. The spot is formed and characteristics of the reflected radiation are measured, from which the mean-square value of roughness Rq is determined. Also dimension x of the spot on the measured surface ranging from 0 to L is measured. Dependence function Rq(x) and its derivative Rq'x(x) are determined. Arithmetic average surface roughness Ra is determined using formula: ^ EFFECT: wider functional capabilities due to simultaneous contactless measurement of roughness parametres Rq and Ra. ^ 1 dwg |
申请公布号 |
RU2380655(C1) |
申请公布日期 |
2010.01.27 |
申请号 |
RU20080139239 |
申请日期 |
2008.10.03 |
申请人 |
MIRONCHENKO VLADIMIR IL'ICH |
发明人 |
MIRONCHENKO VLADIMIR IL'ICH |
分类号 |
G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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