发明名称 METHOD FOR CONTACTLESS MEASUREMENT OF SURFACE ROUGHNESS PARAMETRES
摘要 FIELD: physics. ^ SUBSTANCE: maximum dimension L of a spot on the measured surface is given. A beam of probe radiation is directed on the spot. The spot is formed and characteristics of the reflected radiation are measured, from which the mean-square value of roughness Rq is determined. Also dimension x of the spot on the measured surface ranging from 0 to L is measured. Dependence function Rq(x) and its derivative Rq'x(x) are determined. Arithmetic average surface roughness Ra is determined using formula: ^ EFFECT: wider functional capabilities due to simultaneous contactless measurement of roughness parametres Rq and Ra. ^ 1 dwg
申请公布号 RU2380655(C1) 申请公布日期 2010.01.27
申请号 RU20080139239 申请日期 2008.10.03
申请人 MIRONCHENKO VLADIMIR IL'ICH 发明人 MIRONCHENKO VLADIMIR IL'ICH
分类号 G01B11/00 主分类号 G01B11/00
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