| 摘要 |
PROBLEM TO BE SOLVED: To provide an optoelectronic circuit board which allows an optical element and an optical waveguide to be tested while the optical element is mounted on the board. SOLUTION: A first optical waveguide 13A is provided with a merging optical waveguide 14, and a second optical waveguide 13B is provided with a branch optical waveguide 15. A first optical signal 20 for test is introduced to the merging optical waveguide 14 from an aperture 140 for introduction, and an optoelectronic circuit board 1 can be tested by whether a first optical module 12A receives the first optical signal for test propagated in the first optical waveguide 13A from the merging optical waveguide 14 or not. An optical signal 2 transmitted from the first optical module 12A is propagated in the second optical waveguide 13B, and a part of the optical signal 2 is propagated to the branch optical waveguide 15. The optoelectronic circuit board can be tested by whether a light receiving device 4 has received a part of the optical signal 2 as a second optical signal 21 for test from the branch optical waveguide 15 through an aperture 150 for taking-out or not. COPYRIGHT: (C)2008,JPO&INPIT |
