发明名称 SONOS floating trap memory device formed in recess with the lower surface of the conductive gate formed higher that the upper surface of the active region
摘要 In an example embodiment, a semiconductor substrate has a plurality of active regions separated by a plurality of trenches. A gate insulation film fills at least a portion of the trenches, and a conductive gate film is formed over the gate insulation film. In an example embodiment, the gate insulation film, may include a tunneling insulation film, a charge storage film, and a blocking insulation film. The example embodiment may also include field isolation films, which partially fill the trenches of the semiconductor substrate, such that the upper surfaces of the active regions or the substrate are higher than the upper surfaces of the field isolation films.
申请公布号 US7714379(B2) 申请公布日期 2010.05.11
申请号 US20050296479 申请日期 2005.12.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE CHANG-HYUN
分类号 H01L29/792 主分类号 H01L29/792
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