| 摘要 |
A contact probe is provided to reduce a contact diameter of a coil spring contacted with the lower part and upper part of plunger by using a cylindrical coil spring. In a contact probe, a probe protrusion is contacted with a connection terminal of a semiconductor chip. A probe protrusion is formed in an upper plunger(10), and the upper plunger has a flat lower surface. Both sides of a barrel(20) are opened and the lower part of the top plunger is received to the barrel. A coil spring(30) is received into the barrel, and the upper part of the coil spring is contacted with the lower side of the top plunger and the lower part of the coil spring is contacted with the upper side of the lower part plunger. The top of the lower part plunger(40) is received to the barrel, and the lower part plunger has the flat upper side. |
