发明名称 |
MASK CLEANING METHOD, MASK CLEANING APPARATUS, AND PELLICLE |
摘要 |
Embodiments disclose a method for cleaning a mask having a mask film that is of a surface to which a foreign substance containing silicon oxide adheres. In the method, the mask is retained in a cleaning gas containing diluted hydrofluoric acid vapor at a temperature at which an etching rate to the foreign substance becomes higher than an etching rate to the mask film. Further, in the method, the cleaning gas is supplied to the surface of the mask to etch the foreign substance.
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申请公布号 |
US2011203611(A1) |
申请公布日期 |
2011.08.25 |
申请号 |
US20100965006 |
申请日期 |
2010.12.10 |
申请人 |
UEMURA ERI;KATANO MAKIKO;YAMADA YUJI |
发明人 |
UEMURA ERI;KATANO MAKIKO;YAMADA YUJI |
分类号 |
B08B5/00;B08B7/00;G03F1/82;H01L21/302;H01L21/304;H01L21/3065 |
主分类号 |
B08B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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