发明名称 FinFET and method of fabricating the same
摘要 The disclosure relates to a fin field effect transistor (FinFET). An exemplary structure for a FinFET comprises a substrate comprising a top surface; a first insulation region and a second insulation region over the substrate top surface comprising tapered top surfaces; a fin of the substrate extending above the substrate top surface between the first and second insulation regions, wherein the fin comprises a recessed portion having a top surface lower than the tapered top surfaces of the first and second insulation regions, wherein the fin comprises a non-recessed portion having a top surface higher than the tapered top surfaces; and a gate stack over the non-recessed portion of the fin.
申请公布号 US8440517(B2) 申请公布日期 2013.05.14
申请号 US20100903712 申请日期 2010.10.13
申请人 LIN HUNG-TA;FU CHU-YUN;HUANG SHIN-YEH;YANG SHU-TINE;CHEN HUNG-MING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN HUNG-TA;FU CHU-YUN;HUANG SHIN-YEH;YANG SHU-TINE;CHEN HUNG-MING
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项
地址