发明名称 Embedded Magnetic Random Access Memory (MRAM)
摘要 A magnetic random access memory (MRAM) cell includes an embedded MRAM and an access transistor. The embedded MRAM is formed on a number of metal-interposed-in-interlayer dielectric (ILD) layers, which each include metal dispersed there through and are formed on top of the access transistor. A magneto tunnel junction (MTJ) is formed on top of a metal formed in the ILD layers that is in close proximity to a bit line. An MTJ mask is used to pattern the MTJ and is etched to expose the MTJ. Ultimately, metal is formed on top of the bit line and extended to contact the MTJ.
申请公布号 US2013302914(A1) 申请公布日期 2013.11.14
申请号 US201313931614 申请日期 2013.06.28
申请人 AVALANCHE TECHNOLOGY, INC. 发明人 KESHTBOD PARVIZ;ABEDIFARD EBRAHIM
分类号 H01L43/12 主分类号 H01L43/12
代理机构 代理人
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