发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE, AND SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide: a method for manufacturing a semiconductor substrate which enables the improvement of a GaN layer in crystal quality; and a semiconductor device arranged by use of the semiconductor substrate.SOLUTION: A method for manufacturing a semiconductor substrate 1 comprises the steps of: growing an AlN layer 3 on a substrate 2; growing an AlGaN layer 4, of which the content of Al is 3.5-9%, on a surface 3a of the AlN layer 3 with Group III gas and Group V gas; growing a GaN layer 5 having a thickness of 250-1400 nm on a surface 4a of the AlGaN layer 4 with Group III gas and Group V gas; and growing an electron-supply layer 6 on the GaN layer 5. The supply of Group III gas is suspended for a length of time included in a range of 80-220 seconds after the growth of the AlGaN layer 4, but before the growth of the GaN layer 5.</p>
申请公布号 JP2015185809(A) 申请公布日期 2015.10.22
申请号 JP20140063797 申请日期 2014.03.26
申请人 SUMITOMO ELECTRIC IND LTD 发明人 YUI KEIICHI;NAKADA TAKESHI;MAKABE ISAO;KOUCHI TAKESHI
分类号 H01L21/338;H01L21/205;H01L29/778;H01L29/812 主分类号 H01L21/338
代理机构 代理人
主权项
地址