发明名称 Hole examining device
摘要 In a hole examining device, an examination head (105) is supported to be movable in an X direction and a Y direction which are orthogonal to each other, measurement heads (125, 126) are supported to be movable in a Z direction which is orthogonal to the X direction and the Y direction with respect to the examination head (105), and a plurality of first measurers (127) and a plurality of second measurers (128) are arranged in the measurement heads (125, 126) in parallel and may be held at an advance position which advances as well as retreats with respect to the Z direction, thereby improving workability of an examining operation.
申请公布号 US9212881(B2) 申请公布日期 2015.12.15
申请号 US201113878511 申请日期 2011.11.08
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD. 发明人 Kasubata Yoshitake;Ishii Masaaki
分类号 G01B3/22;G01B3/00;G01B5/012;G01B5/12;G01B1/00;G01B5/00;G01B3/50;G01B3/16;G01B3/28;G01B5/08;G01B3/20;G01B21/14;G01B3/26 主分类号 G01B3/22
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A hole examining device, comprising: a moving body supported to be movable in two directions which cross each other; a measurement head supported to be movable in a direction crossing a movement direction of the moving body with respect to the moving body; a measurement head moving device capable of moving the measurement head with respect to the moving body; a plurality of measurers supported to be movable in the same direction as a movement direction of the measurement head with respect to the measurement head; and a measurer holding mechanism capable of holding the measurer at an advance position which advances as well as retreats, wherein the plurality of measurers includes a first measurer having a first size insertable in the hole formed in the examined member when the hole is larger than a minimum tolerance and a second measurer having a second size which is not insertable in the hole formed in the examined member when the hole is smaller than a maximum tolerance.
地址 Tokyo JP