发明名称 APPARATUS, PROCESS, AND SYSTEM FOR MONITORING THE INTEGRITY OF CONTAINERS
摘要 <p>Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material. 1954074v1 (001 (01N N(</p>
申请公布号 AU2015258297(A1) 申请公布日期 2015.12.10
申请号 AU20150258297 申请日期 2015.11.20
申请人 PROCESS METRIX 发明人 BONIN, MICHEL PIERRE;HARVILL, THOMAS LAWRENCE;HOOG, JARED HUBERT
分类号 G01B11/06;G01N25/72 主分类号 G01B11/06
代理机构 代理人
主权项
地址