发明名称 |
Electromagnetic wave imaging apparatus |
摘要 |
A first optical system irradiates a target with a detecting wave and making the detecting wave that is transmitted through the target incident upon the electrooptical crystal. A second optical system slants a pulse plane of a probe wave relative to a pulse plane of the detecting wave and making the probe wave incident upon the electrooptical crystal. A camera detects the probe wave passing through the electrooptical crystal. The first or second optical system includes a compensating component which partitions a beam cross section of the detecting wave or the probe wave into unit areas. The optical component makes different an optical path length of a beam passing each unit area and compensates a phase shifting between the pulse plane of the detecting wave and the pulse plane of the probe wave at positions in a crossing direction of a surface of the electrooptical crystal and the virtual plane. |
申请公布号 |
US9204063(B2) |
申请公布日期 |
2015.12.01 |
申请号 |
US201113251670 |
申请日期 |
2011.10.03 |
申请人 |
FUJITSU LIMITED |
发明人 |
Itani Norihiko;Maruyama Kazunori;Hasegawa Shinya |
分类号 |
H04N7/18;H04N5/335;H04N5/30;G01S7/481;G01S17/89;G02F1/03;G01N21/3581 |
主分类号 |
H04N7/18 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. An electromagnetic wave imaging apparatus comprising:
an electrooptical crystal; a first optical system irradiating a measurement target with a pulsed detecting electromagnetic wave and making the detecting electromagnetic wave that is transmitted through or reflected by the measurement target incident upon the electrooptical crystal; a second optical system slanting a pulse plane of a pulsed probe wave for imaging relative to a pulse plane of the detecting electromagnetic wave and making the probe wave incident upon the electrooptical crystal; a camera detecting the probe wave passing through the electrooptical crystal; and a phase shifting component generating a plurality of optical path length differences in a direction perpendicular to a virtual plane, included in the first or second optical system, wherein the first optical system or the second optical system includes a compensating optical component which partitions a beam cross section of the detecting electromagnetic wave or the probe wave into a plurality of unit areas in the virtual plane perpendicular to a pulse plane of the detecting electromagnetic wave and to a pulse plane of the probe wave, the optical component making different an optical path length of a beam passing each unit area and compensating a phase shifting between the pulse plane of the detecting electromagnetic wave and the pulse plane of the probe wave at a plurality of positions in a crossing direction of a surface of the electrooptical crystal and the virtual plane, and wherein the compensating optical component includes two step-like mirrors having a plurality of reflection planes, sizes and positions of which are different from each other in a beam propagation direction with respect to a width direction and a length direction of the electromagnetic wave or the probe wave. |
地址 |
Kawasaki JP |