发明名称 半導体装置の作製方法
摘要 <p>A technique of manufacturing a semiconductor device in which etching in formation of a contact hole can be easily controlled is proposed. A semiconductor device includes at least a semiconductor layer formed over an insulating surface; a first insulating layer formed over the semiconductor layer; a gate electrode formed over the first insulating layer; a second insulating layer formed over the gate electrode; and a conductive layer formed over the second insulating layer connected to the semiconductor layer via an opening which is formed at least in the semiconductor layer and the second insulating layer and partially exposes the insulating surface. The conductive layer is electrically connected to the semiconductor layer at the side surface of the opening which is formed in the semiconductor layer.</p>
申请公布号 JP5820496(B2) 申请公布日期 2015.11.24
申请号 JP20140065147 申请日期 2014.03.27
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;須澤 英臣;笹川 慎也;倉田 求
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/336;H01L21/768;H01L23/522 主分类号 H01L29/786
代理机构 代理人
主权项
地址