发明名称 SURFACE MODIFICATION OF PHASE SHIFT MASK AND CLEANING METHOD USING THEREOF
摘要 The present invention relates to a method for modifying a surface of a phase shift mask (PSM), and a method for cleaning using the same and, more specifically, to a method for modifying a surface of a phase shift mask having a phase shift pattern on a transparent substrate through a plasma or an annealing process, and a method for cleaning using the method for modifying the surface.
申请公布号 KR20150122957(A) 申请公布日期 2015.11.03
申请号 KR20140049159 申请日期 2014.04.24
申请人 SK HYNIX INC.;INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 LIM, SANG WOO;CHOO, HYEOK SEONG;SEO, DONG WAN
分类号 H01L21/027;G03F1/26;H01L21/3065;H01L21/324 主分类号 H01L21/027
代理机构 代理人
主权项
地址