发明名称 CONFORMAL AMORPHOUS CARBON FOR SPACER AND SPACER PROTECTION APPLICATIONS
摘要 A method of forming a nitrogen-doped amorphous carbon layer on a substrate in a processing chamber is provided. The method generally includes depositing a predetermined thickness of a sacrificial dielectric layer over a substrate, forming patterned features on the substrate by removing portions of the sacrificial dielectric layer to expose an upper surface of the substrate, depositing conformally a predetermined thickness of a nitrogen-doped amorphous carbon layer on the patterned features and the exposed upper surface of the substrate, selectively removing the nitrogen-doped amorphous carbon layer from an upper surface of the patterned features and the upper surface of the substrate using an anisotropic etching process to provide the patterned features filled within sidewall spacers formed from the nitrogen-doped amorphous carbon layer, and removing the patterned features from the substrate.
申请公布号 US2015279676(A1) 申请公布日期 2015.10.01
申请号 US201514736848 申请日期 2015.06.11
申请人 Applied Materials, Inc. 发明人 KIM Sungjin;PADHI Deenesh;HONG Sung Hyun;KIM Bok Hoen;WITTY Derek R.
分类号 H01L21/033;H01L21/311;H01L21/02 主分类号 H01L21/033
代理机构 代理人
主权项 1. A method of processing a substrate in a processing chamber, comprising: depositing a dielectric layer on a substrate; depositing a sacrificial structural layer on an upper surface of the dielectric layer; transferring a pattern into the sacrificial structural layer by removing portions of the sacrificial structural layer to expose portions of the upper surface of the dielectric layer; forming a spacer layer conformally on the portions of the upper surface of the dielectric layer and on remaining portions of the sacrificial structural layer; forming a protection layer conformally on the spacer layer, wherein the protection layer is an amorphous carbon material; selectively removing the protection layer using an anisotropic etching process to expose the spacer layer on remaining upper surfaces of the sacrificial structural layer and to expose the spacer layer on the portions of the upper surface of the dielectric layer; selectively removing the spacer layer using an anisotropic etching process to expose the upper surface of the patterned sacrificial structural layer and to expose the upper surface of the dielectric layer; removing the protection layer from the side surfaces of the patterned sacrificial structural layer; and removing the patterned sacrificial structural layer and exposed portions of the dielectric layer using the spacer layer as a hardmask.
地址 Santa Clara CA US