发明名称 VERTICAL NAND DEVICE WITH SHARED WORD LINE STEPS
摘要 A memory device includes a memory cell array having a first side and a second side and a stepped word line contact region located between the first side and the second side of the memory array. A first word line stair pattern is located in the stepped word line contact region adjacent to the first side of the memory array and a second word line stair pattern located in the stepped word line contact region adjacent to the second side of the memory array. A peripheral device region located in the stepped word line contact region between the first and the second word line stair patterns.
申请公布号 US2015279852(A1) 申请公布日期 2015.10.01
申请号 US201414320865 申请日期 2014.07.01
申请人 SanDisk Technologies Inc. 发明人 Mizutani Yuki;Toyama Fumiaki
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A memory device, comprising: a memory cell array having a first side and a second side; a stepped word line contact region located between the first side and the second side of the memory cell array; a first word line stair pattern located in the stepped word line contact region adjacent to the first side of the memory cell array; a second word line stair pattern located in the stepped word line contact region adjacent to the second side of the memory cell array; and a peripheral device region located in the stepped word line contact region between the first and the second word line stair patterns.
地址 Plano TX US
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