发明名称 |
WORKPIECE PROCESSING SYSTEM, WORKPIECE PROCESSING METHOD, EXPOSURE APPARATUS, EXPOSURE METHOD, COATER/DEVELOPER, COATING/DEVELOPING METHOD AND DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a workpiece processing system capable of forming a uniform pattern, and to provide a workpiece processing method, exposure apparatus, exposure method, coater/developer, coating/developing method and device manufacturing method. SOLUTION: The workpiece processing system includes: a first processing device for performing first processing for a workpiece; and a second processing device for executing second processing to the workpiece and supplying the workpiece after second processing to the first processing device. The system further includes a controller for putting the workpiece before the second processing in a standby state on the basis of the difference in processing time caused by the difference in capability between the first processing device and the second processing device. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009076579(A) |
申请公布日期 |
2009.04.09 |
申请号 |
JP20070242600 |
申请日期 |
2007.09.19 |
申请人 |
NIKON CORP;TOKYO ELECTRON LTD |
发明人 |
KUMAZAKI KIYOAKI;FUJIMA TOSHIHISA;KANEKO TOMOHIRO;MIYATA AKIRA |
分类号 |
H01L21/027;H01L21/677 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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地址 |
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