发明名称 OPERATING METHOD OF NONVOLATILE MEMORY DEVICE
摘要 PURPOSE: An operating method of a nonvolatile memory device is provided to manage a bad block more efficiently by processing an ECC(Error Correction Circuit) according to the number of error bits. CONSTITUTION: A memory cell array(102) comprises 1024 memory blocks. A controller(112) generates a program command signal according to a signal which is received from an IO buffer(118). A high voltage generator(110) generates a bias voltage in response to the program command, an erase command, and a read command. An address generator(120) generates a column address signal. An X-decoder(104) supplies the bias voltage to one of the memory blocks.
申请公布号 KR20100129068(A) 申请公布日期 2010.12.08
申请号 KR20090047824 申请日期 2009.05.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HAN, JUNG CHUL;JEONG, BYOUNG KWAN
分类号 G11C16/34;G11C16/06;G11C29/42 主分类号 G11C16/34
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