发明名称 |
OPERATING METHOD OF NONVOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: An operating method of a nonvolatile memory device is provided to manage a bad block more efficiently by processing an ECC(Error Correction Circuit) according to the number of error bits. CONSTITUTION: A memory cell array(102) comprises 1024 memory blocks. A controller(112) generates a program command signal according to a signal which is received from an IO buffer(118). A high voltage generator(110) generates a bias voltage in response to the program command, an erase command, and a read command. An address generator(120) generates a column address signal. An X-decoder(104) supplies the bias voltage to one of the memory blocks.
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申请公布号 |
KR20100129068(A) |
申请公布日期 |
2010.12.08 |
申请号 |
KR20090047824 |
申请日期 |
2009.05.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HAN, JUNG CHUL;JEONG, BYOUNG KWAN |
分类号 |
G11C16/34;G11C16/06;G11C29/42 |
主分类号 |
G11C16/34 |
代理机构 |
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主权项 |
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地址 |
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