发明名称 Methods and apparatus for implementing bit-by-bit erase of a flash memory device
摘要 A NAND memory device is constructed using Silicon On Insulator (SOI) techniques. In particular, Thin Film Transistor (TFT) techniques can be used to fabricate the NAND Flash memory device. In both SOI and TFT structures, the body, or well, is isolated. This can be used to enable a bit-by-bit programming and erasing of individual cells and allows tight control of the threshold voltage, which can enable MLC operation.
申请公布号 US7907450(B2) 申请公布日期 2011.03.15
申请号 US20060549502 申请日期 2006.10.13
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUE HANG-TING;LAI ERH KUN
分类号 G11C16/04 主分类号 G11C16/04
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