Method for forming bumps, semiconductor device and method for manufacturing same, substrate processing apparatus, and semiconductor manufacturing apparatus

摘要

A semiconductor substrate is secured by suction to a rear face of a supporting face of a substrate supporting table. In this event, the thickness of the semiconductor substrate is made fixed by planarization on the rear face, and the rear face is forcibly brought into a state free from undulation by the suction to the supporting face, so that the rear face becomes a reference face for planarization of a front face. In this state, a tool is used to cut surface layers of Au projections and a resist mask on the front face, thereby planarizing the Au projections and the resist mask so that their surfaces become continuously flat. This can planarize the surfaces of fine bumps formed on the substrate at a low cost and a high speed in place of CMP.

主权项

1. A method for forming on a front face of a substrate bumps for establishing an electrical connection with an external part, said method comprising the steps of:
forming the plurality of bumps and an insulating film between the bumps on the front face of the substrate; performing planarization by cutting using a tool so that surfaces of the bumps and a surface of the insulating film become continuously flat; and removing the insulating film; wherein the surfaces of the bumps are subjected to the cutting so that the bumps have the same height on the substrate; further comprising the step of: performing planarization by machining on a rear face of the substrate with securing the substrate at a front face side of the substrate, wherein the planarization of the surfaces of the bumps and the surface of the insulating film is performed with securing the substrate at a rear face of the substrate; wherein in performing planarization of the surfaces of the bumps and the surface of the insulating film, correction of parallelism of the semiconductor substrate is performed with reference to the rear face, and a position of the front face is detected, so that a cutting amount is calculated from the detected front face for control; and wherein in detecting the position of the front face of the substrate, laser light is applied to the insulating film at a plurality of points within a peripheral region of the front face to heat and scatter an insulator to thereby expose portions of the front face.