发明名称 |
MICRORESISTIVITY IMAGING AT MULTIPLE DEPTHS OF INVESTIGATION |
摘要 |
A microresistivity logging tool includes a dual function electrode deployed between a guard electrode and a return electrode. A drive circuit enables the electrical potential of the dual function electrode to be independently controlled so as to control a depth of investigation of a microresistivity measurement. The depth of investigation tends to increase with increasing electrical potential of the dual function electrode. |
申请公布号 |
EP2491434(A4) |
申请公布日期 |
2015.09.30 |
申请号 |
EP20100825487 |
申请日期 |
2010.10.19 |
申请人 |
SERVICES PÉTROLIERS SCHLUMBERGER;SCHLUMBERGER HOLDINGS LIMITED;SCHLUMBERGER TECHNOLOGY B.V. (STBV);PRAD RESEARCH AND DEVELOPMENT LIMITED |
发明人 |
WANG, TSILI |
分类号 |
G01V3/20;E21B47/00 |
主分类号 |
G01V3/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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