发明名称 Method for manufacturing optical semiconductor device
摘要 A method for manufacturing an optical semiconductor device includes a step of forming a stacked semiconductor layer on a substrate, the stacked semiconductor layer including a plurality of semiconductor layers; a step of forming a mask on a top layer of the stacked semiconductor layer, the mask covering a portion of the top layer; an exposing step of exposing the top layer of the stacked semiconductor layer to an oxygen-containing atmosphere; after the exposing step, a heating step of heating the stacked semiconductor layer to a temperature of 250° C. or more; and after the heating step, a step of forming a semiconductor mesa in the stacked semiconductor layer, the semiconductor mesa being formed by etching the stacked semiconductor layer by a dry etching method using the mask. The top layer of the plurality of semiconductor layers of the stacked semiconductor layer contains arsenic.
申请公布号 US9123539(B2) 申请公布日期 2015.09.01
申请号 US201313734083 申请日期 2013.01.04
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 Masuyama Ryuji
分类号 H01L21/28;H01L21/3205;H01L21/00;H01L21/02;H01L21/3065;H01L21/308;H01S5/22 主分类号 H01L21/28
代理机构 Smith, Gambrell & Russell LLP. 代理人 Smith, Gambrell & Russell LLP.
主权项 1. A method for manufacturing an optical semiconductor device, comprising: a step of forming a stacked semiconductor layer on a substrate, the stacked semiconductor layer including a plurality of semiconductor layers with a top layer of the plurality of layers containing arsenic; a step of forming a mask on the top layer whereby a portion of the top layer is covered by the mask and a region of the top layer is not covered by the mask; an exposing step of exposing the region of the top layer not covered by the mask to an oxygen-containing atmosphere whereby arsenic oxide forms on the region; after the exposing step, a heating step of heating the stacked semiconductor layer to a temperature of 250° C. or more to remove arsenic oxide from the top layer; and after the heating step, a step of forming a semiconductor mesa in the stacked semiconductor layer, the semiconductor mesa being formed by etching the stacked semiconductor layer by a dry etching method using the mask.
地址 Osaka JP