发明名称 SYSTEM INTEGRATION TESTING APPARATUS USING DUAL PROTECTION CIRCUIT
摘要 <p>Disclosed is a system integration testing apparatus using a dual protection circuit, and an operation method thereof. The system integration testing apparatus according to the present invention includes: a control circuit part which is connected to related equipment to be tested and corresponding equipment models, applies power to operate one selected among the related equipment and the corresponding equipment model, and stops power not to operate the other; and a manager terminal which a manager selects among the equipment models and the related equipment.</p>
申请公布号 KR101548719(B1) 申请公布日期 2015.09.01
申请号 KR20150025692 申请日期 2015.02.24
申请人 LIG NEX1 CO., LTD. 发明人 HONG, HYUN WOOK
分类号 G05B23/02 主分类号 G05B23/02
代理机构 代理人
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