发明名称 SEMICONDUCTOR DEVICE
摘要 A gate interconnection portion (GHB) includes a first gate interconnection portion (GHB1), a second gate interconnection portion (GHB2), and a third gate interconnection portion (GHB3). The first gate interconnection portion (GHB1) is formed in parallel to a Y axis direction toward a power supply interconnection and extends to a prescribed position within an element formation region (PER). The second gate interconnection portion (GHB2) is formed in parallel to a direction obliquely bent with respect to the Y-axis direction from the first gate interconnection portion (GHB1) toward the power supply interconnection, and extends across a boundary between the element formation region (PER) and an element isolation insulating film (EB), which is in parallel to an X axis direction. The third gate interconnection portion (GHB3) further extends in parallel to the Y-axis direction from the second gate interconnection portion (GHB2) toward the power supply interconnection.
申请公布号 US2015243735(A1) 申请公布日期 2015.08.27
申请号 US201514711771 申请日期 2015.05.14
申请人 Renesas Electronics Corporation 发明人 TOMITA Kazuo;OASHI Toshiyuki;SATO Hidenori
分类号 H01L29/06;H01L29/45;H01L23/528;H01L27/092;H01L29/10 主分类号 H01L29/06
代理机构 代理人
主权项
地址 Kawasaki-shi JP