发明名称 |
Semiconductor Device And Manufacturing Method Of The Same |
摘要 |
An object is to improve the electrical characteristics of a semiconductor device. A semiconductor device using a hexagonal semiconductor is provided. The semiconductor device comprises a semiconductor substrate, a first N-type semiconductor layer formed on the semiconductor substrate, a P-type semiconductor layer formed on the first N-type semiconductor layer, a second N-type semiconductor layer formed on the P-type semiconductor layer, and a trench concaved to pass through the second N-type semiconductor layer and the P-type semiconductor layer and reach the first N-type semiconductor layer. The trench is arranged to have a longitudinal direction thereof at right angle ±15 degrees to an [11-20] axis and has concavity/convexity in a striped pattern formed on a side wall of the trench to be at right angle to a [0001] axis. |
申请公布号 |
US2015243516(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
US201514616574 |
申请日期 |
2015.02.06 |
申请人 |
TOYODA GOSEI CO., LTD. |
发明人 |
INA Tsutomu;OKA Tohru |
分类号 |
H01L21/306;H01L21/308;H01L29/20;H01L29/66;H01L29/78;H01L29/423 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device using a hexagonal semiconductor, comprising:
a semiconductor substrate; a first N-type semiconductor layer formed on the semiconductor substrate; a P-type semiconductor layer formed on the first N-type semiconductor layer; a second N-type semiconductor layer formed on the P-type semiconductor layer; and a trench concaved to pass through the second N-type semiconductor layer and the P-type semiconductor layer and reach the first N-type semiconductor layer, wherein the trench is arranged to have a longitudinal direction thereof at right angle ±15 degrees to an [11-20] axis and has concavity/convexity in a striped pattern formed on a side wall of the trench to be at right angle to a [0001] axis. |
地址 |
Kiyosu-shi JP |