发明名称 Semiconductor Device And Manufacturing Method Of The Same
摘要 An object is to improve the electrical characteristics of a semiconductor device. A semiconductor device using a hexagonal semiconductor is provided. The semiconductor device comprises a semiconductor substrate, a first N-type semiconductor layer formed on the semiconductor substrate, a P-type semiconductor layer formed on the first N-type semiconductor layer, a second N-type semiconductor layer formed on the P-type semiconductor layer, and a trench concaved to pass through the second N-type semiconductor layer and the P-type semiconductor layer and reach the first N-type semiconductor layer. The trench is arranged to have a longitudinal direction thereof at right angle ±15 degrees to an [11-20] axis and has concavity/convexity in a striped pattern formed on a side wall of the trench to be at right angle to a [0001] axis.
申请公布号 US2015243516(A1) 申请公布日期 2015.08.27
申请号 US201514616574 申请日期 2015.02.06
申请人 TOYODA GOSEI CO., LTD. 发明人 INA Tsutomu;OKA Tohru
分类号 H01L21/306;H01L21/308;H01L29/20;H01L29/66;H01L29/78;H01L29/423 主分类号 H01L21/306
代理机构 代理人
主权项 1. A semiconductor device using a hexagonal semiconductor, comprising: a semiconductor substrate; a first N-type semiconductor layer formed on the semiconductor substrate; a P-type semiconductor layer formed on the first N-type semiconductor layer; a second N-type semiconductor layer formed on the P-type semiconductor layer; and a trench concaved to pass through the second N-type semiconductor layer and the P-type semiconductor layer and reach the first N-type semiconductor layer, wherein the trench is arranged to have a longitudinal direction thereof at right angle ±15 degrees to an [11-20] axis and has concavity/convexity in a striped pattern formed on a side wall of the trench to be at right angle to a [0001] axis.
地址 Kiyosu-shi JP