发明名称 DETECTION APPARATUS, IMPRINT APPARATUS, AND METHOD OF MANUFACTURING PRODUCTS
摘要 This disclosure provides a detection apparatus configured to detect a moire pattern generated by grid patterns having grid pitches different from each other including: an image-pickup unit configured to pick up an image of the moire pattern; an imaging optical system configured to cause the image-pickup unit to image the moire pattern; and a processing unit configured to process an image-pickup result of the moire pattern imaged by the image-pickup unit, wherein a mark including a plurality of patterns having a width not larger than the resolving power of the imaging optical system arranged in a measuring direction and changed in duty ratio between the widths and intervals of the plurality of patterns is imaged by the image-pickup unit, and the processing unit evaluates the detection apparatus by processing the image-pickup result of the mark picked up by the image-pickup unit.
申请公布号 US2015235880(A1) 申请公布日期 2015.08.20
申请号 US201514621238 申请日期 2015.02.12
申请人 CANON KABUSHIKI KAISHA 发明人 Inada Hiroshi;Mishima Kazuhiko;Miyaharu Takafumi
分类号 H01L21/67;H01L21/304;G06T7/00;H01L21/66;H04N7/18;H04N5/232 主分类号 H01L21/67
代理机构 代理人
主权项 1. A detection apparatus configured to detect a moire pattern generated by grid patterns having grid pitches different from each other comprising: an image-pickup unit configured to pick up an image of the moire pattern; an imaging optical system configured to form the image of the moire pattern on the image-pickup unit; and a processing unit configured to process an image-pickup result of the moire pattern picked up by the image-pickup unit, wherein the image pickup unit picks up an image of a mark including a plurality of patterns having a width not larger than a resolving power of the imaging optical system arranged in a measuring direction and changed in duty ratio between the widths and intervals of the plurality of patterns, and the processing unit evaluates the detection apparatus by processing the image-pickup result of the mark picked up by the image-pickup unit.
地址 Tokyo JP
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