发明名称 PROJECTION EXPOSURE DEVICE WITH OPTIMIZED ADJUSTMENT FUNCTION
摘要 PROBLEM TO BE SOLVED: To provide a projection device for microlithography for photographing the visual field of an object.SOLUTION: A projection device includes an objective lens 110, at least one or more manipulators 121, 122, and 123 that manipulate one or more optical elements of the objective lens, a control unit 130 that adjusts or controls the one or more manipulators, a determination device 150 that determines at least one or more image aberrations of the objective lens, and a memory 140 that stores one or more upper bounds related to the specification of the objective lens including an upper bound of the image aberrations and/or the amount of travel of the manipulators.
申请公布号 JP2015146419(A) 申请公布日期 2015.08.13
申请号 JP20150018556 申请日期 2015.02.02
申请人 CARL ZEISS SMT GMBH 发明人 BORIS BITTNER;HOLGER WALTER;MATTHIAS ROESCH
分类号 H01L21/027;G02B13/14;G02B13/18;G02B13/24;G03F7/20 主分类号 H01L21/027
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