发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a new semiconductor device using a conductive film containing Cu for a wiring and such in a transistor using an oxide semiconductor film.SOLUTION: The semiconductor device includes: a first insulation film; an oxide semiconductor on the first insulation film; a gate electrode that overlaps with the oxide semiconductor through a gate insulation film; a second insulation film that is in contact with a side face of the gate electrode; and a third insulation film that is in contact with a top surface of the gate electrode. The gate electrode contains a Cu-X alloy film (X is a mixture of Mn, Ni, Cr, Fe, Co, Mo, Ta, Ti, Zr, Mg, Ca, or mixture of two or more kinds thereof).
申请公布号 JP2015144251(A) 申请公布日期 2015.08.06
申请号 JP20140250486 申请日期 2014.12.11
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU
分类号 H01L29/786;H01L21/28;H01L21/336;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792;H01L51/50;H05B33/14;H05B33/22 主分类号 H01L29/786
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