发明名称 MANUFACTURING METHOD OF POLISHING LIQUID AND POLISHING LIQUID, AND POLISHING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a polishing liquid having small wiring density dependency and excellent in surface flatness after polishing and over-polishing resistance in a CMP technology for polishing a film to be polished formed on a surface of a substrate.SOLUTION: There is provided a polishing liquid containing cerium oxide particles, an acrylic acid-based polymer, an organic acid compound, a pH adjustment agent, and water, where the acrylic acid-based polymer is a polymer obtained by polymerizing a monomer component containing at least one kind selected from a group consisting of acrylic acid and methacrylic acid, a ratio of the blended amount of the organic acid compound to the total mass of the polishing liquid (B mass%) to the blended amount of the acrylic acid-based polymer to the total mass of the polishing liquid (A mass%), (B/A) is 0.5 to 2.5, and pH is 4.0 to 6.0.</p>
申请公布号 JP2015137290(A) 申请公布日期 2015.07.30
申请号 JP20140008476 申请日期 2014.01.21
申请人 HITACHI CHEMICAL CO LTD 发明人 MATSUMOTO TAKAAKI;TANAKA TAKAAKI;YAMASHITA TETSURO
分类号 C09K3/14;B24B37/00;H01L21/304 主分类号 C09K3/14
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