发明名称 半導体装置の製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing method which can uniformly deposit a film on a whole sidewall of an aperture area formed on a semiconductor substrate. <P>SOLUTION: A semiconductor device manufacturing method according to an embodiment of the present invention comprises: forming, on a semiconductor substrate on which an element is formed, an opening part including a bottom wall and a sidewall having a plurality of recesses; depositing a deposition component on the bottom wall and in each recess of the sidewall on the bottom wall side by performing vapor deposition or sputtering from the opening part side; and depositing the deposition component in each recess of the side wall on the opening part side by performing sputtering with applying a predetermined voltage to the semiconductor substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5754209(B2) 申请公布日期 2015.07.29
申请号 JP20110077874 申请日期 2011.03.31
申请人 发明人
分类号 H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/3205
代理机构 代理人
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