THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREMENT METHOD AND PROGRAM

摘要

A pattern having identification features on measurement lines of a multi-slit is projected to an object, and an image is acquired. Based on positions of identification features detected from the image, a measurement line number is identified for each identification feature. Based on a position of a selected identification feature on the image, a position and a slope of an epipolar line in a coordinate system of the pattern are calculated. The position and slope of the epipolar line are calculated by projecting a straight line extending from the position of the selected identification feature to a line-of-sight direction onto the coordinate system. Because the position of the selected identification feature in the coordinate system is on the epipolar line, a measurement line having an identification feature on the epipolar line is searched on the pattern to identify the measurement line number for the selected identification feature.

主权项

1. A three-dimensional measurement apparatus comprising:
an outputting unit configured to project a pattern which includes a plurality of lines and in which at least a part of features on the plurality of lines are arranged at unequal intervals from a projection unit to an object; an acquiring unit configured to acquire an image including an object to which the pattern is projected; a detecting unit configured to detect lines and features of the projected pattern from the image acquired by the acquiring unit; an identifying unit configured to identify to which line of the plurality of lines of the pattern each of the features detected by the detecting unit belongs based on positions of the features detected by the detecting unit; and a measuring unit configured to measure a three-dimensional shape of the object to which the pattern is projected based on an identification result of the identifying unit.