MEMORY DEVICE, MEMORY SYSTEM AND OPERATING METHOD OF MEMORY DEVICE
摘要
Disclosed are a memory device, a memory system and a memory device operation method. According to an embodiment of the present invention, the memory device operation method includes an on-chip ECC and is composed of the following steps: a step to check errors of data read in from a first address of memory cell array of the memory device; a step to count the number of errors in the first address and saves the counts in a first table; a step to receive a first command for the first address; a step to determine the number of errors in the first address is greater than value 1 by referring to the first table; and a step to map the first address to the second address if the number of errors in the first address is greater than value 1.
申请公布号
KR20150084244(A)
申请公布日期
2015.07.22
申请号
KR20140004062
申请日期
2014.01.13
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHOI, HYO JIN;KIM, SU A;SEO, MU JIN;SEO, SEONG YOUNG;YU, HAK SOO