发明名称 AN X-RAY IMAGE SENSOR WITH COLUMN ADC STRUCTURES AND THE SIGNAL PROCESSING METHOD THEREOF
摘要 <p>The present invention relates to an x-ray image sensor with a column ADC structure and a signal processing method thereof. The present invention includes: an x-ray sensor array unit having multiple x-ray cells receiving x-rays arranged in an array structure; a current source which receives a reset signal and an optical signal of each of the x-ray sensor cells from the x-ray sensor array unit through each column signal line and converts them into electrical analog signals; a free amp which amplifies the analog signals; and a plurality of CDS blocks storing the analog signals individually.</p>
申请公布号 KR101536649(B1) 申请公布日期 2015.07.15
申请号 KR20140039881 申请日期 2014.04.03
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY;CLAIRPIXEL;NANO FOCUS RAY CO., LTD. 发明人 KIM, KYU GYEOM;CHOI, YONG SUK;CHO, GYU SEONG;KIM, MYUNG SOO
分类号 H04N5/32 主分类号 H04N5/32
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