发明名称 |
MANUFACTURING OF LOW DEFECT DENSITY FREE-STANDING GALLIUM NITRIDE SUBSTRATES AND DEVICES FABRICATED THEREOF |
摘要 |
<p>The invention relates to a method for manufacturing a single crystal of nitride by epitaxial growth on a support (100) comprising a growth face (105), the method comprising the steps of: -formation of a sacrificial bed (101) on the support (100), - formation of pillars (102) on said sacrificial bed, said pillars being made of a material compatible with GaN epitaxial growth, - growth of a nitride crystal layer (103) on the pillars, under growing conditions such that the nitride crystal layer does not extend down to the support in holes (107) formed between the pillars, -removing the nitride crystal layer from the support.</p> |
申请公布号 |
CA2747574(C) |
申请公布日期 |
2015.07.14 |
申请号 |
CA20082747574 |
申请日期 |
2008.12.24 |
申请人 |
SAINT-GOBAIN CRISTAUX & DETECTEURS |
发明人 |
BEAUMONT, BERNARD;FAURIE, JEAN-PIERRE |
分类号 |
C30B25/02;C30B25/18;C30B29/40;H01L21/20;H01L21/205 |
主分类号 |
C30B25/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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