发明名称 MANUFACTURING OF LOW DEFECT DENSITY FREE-STANDING GALLIUM NITRIDE SUBSTRATES AND DEVICES FABRICATED THEREOF
摘要 <p>The invention relates to a method for manufacturing a single crystal of nitride by epitaxial growth on a support (100) comprising a growth face (105), the method comprising the steps of: -formation of a sacrificial bed (101) on the support (100), - formation of pillars (102) on said sacrificial bed, said pillars being made of a material compatible with GaN epitaxial growth, - growth of a nitride crystal layer (103) on the pillars, under growing conditions such that the nitride crystal layer does not extend down to the support in holes (107) formed between the pillars, -removing the nitride crystal layer from the support.</p>
申请公布号 CA2747574(C) 申请公布日期 2015.07.14
申请号 CA20082747574 申请日期 2008.12.24
申请人 SAINT-GOBAIN CRISTAUX & DETECTEURS 发明人 BEAUMONT, BERNARD;FAURIE, JEAN-PIERRE
分类号 C30B25/02;C30B25/18;C30B29/40;H01L21/20;H01L21/205 主分类号 C30B25/02
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