发明名称 TOUCH PROBE AND RELATED CHECKING METHOD WITH MINIMIZATION OF THERMAL AND ELECTRICAL NOISE
摘要 <p>A touch probe (1; 1′; 1″; 1′″) for applications in machine tools or measuring machines includes a support frame (2) with a protective casing (3), and a movable armset (5) with a feeler (11) to touch a part to be checked (13). The probe includes a detection device (23) with a laminar piezoelectric transducer (25) made of polymeric material, such as polyvinylidene fluoride, which is connected to the support frame and fixed at a bearing and locating area (7), on which the movable armset rests in a position defined by an isostatic rest system (17). Conditioning electronics (30) connected to the support frame include processing means for processing a force signal (M) provided by the detection device, comparing it with a threshold value (S) and generating a touch signal (T). The conditioning electronics include differential charge amplifiers (3) and a processing system (55) to dynamically vary the threshold value depending on the most recent values of the force signal detected.</p>
申请公布号 EP2633266(B1) 申请公布日期 2015.07.08
申请号 EP20110835655 申请日期 2011.10.25
申请人 MARPOSS SOCIETA' PER AZIONI 发明人 GAMBINI, ANTONIO;DALL'AGLIO, CARLO
分类号 G01B21/04;G01B5/016;G01B7/012;G01B7/016;G01L1/16 主分类号 G01B21/04
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