| 摘要 |
This invention relates to an apparatus (7), a method and a computer program for calculating one or more scattering parameters of a linear network (1, 8), which are related to a reference impedance, on the basis of a measured electrical response at one or more ports (4, 5) of the linear network (1, 8) to an incident wave applied at a port (4) of the linear network (1, 8), measured under the condition that one or more of other ports (6a, 6b, 6c) of the linear network (1, 8) face a reflection coefficient r with an amplitude p of 0.5 or larger. |
