发明名称 LOW COHERENCE INTERFEROMETRY USING ENCODER SYSTEMS
摘要 <p>A method for determining information about changes in a position of an encoder scale includes separating, in a first interferometry cavity, a low coherence beam into a first beam propagating along a first path of the first interferometry cavity and a second beam propagating along a second path of the first interferometry cavity, combining the first beam and the second beam to form a first output beam, separating, in a second interferometry cavity, the first output beam into a measurement beam propagating along a measurement path of the second interferometry cavity and a reference beam propagating along a reference path of the second interferometry cavity, combining the measurement beam and the reference beam to form a second output beam, detecting an interference signal based on the second output beam, and determining the information about changes in the position of the encoder scale based on phase information from the interference signal.</p>
申请公布号 EP2776791(A4) 申请公布日期 2015.06.24
申请号 EP20120847612 申请日期 2012.11.08
申请人 ZYGO CORPORATION 发明人 DECK, LESLIE L.
分类号 G01D5/26;G01B9/02;G01D5/34;G01D5/347;G01D5/353 主分类号 G01D5/26
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