发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device according to the embodiment of the present invention includes the steps of: forming a first wire layer to expose a first conductive layer and a first insulation layer from a surface; forming a second wire layer to expose a second conductive layer and a second insulation layer from the surface; forming a first non-bonding surface on the surface of the first insulation layer by forming a partial region of the surface of the first insulation layer including the surroundings of the first conductive layer to be lower than the surface of the first conductive layer; bonding the surface of the first conductive layer to the surface of the second conductive layer; and bonding the surface of the second insulation layer to the surface of the first insulation layer except the first non-bonding surface. |
申请公布号 |
KR20150068284(A) |
申请公布日期 |
2015.06.19 |
申请号 |
KR20140139847 |
申请日期 |
2014.10.16 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KAWASAKI ATSUKO |
分类号 |
H01L21/768;H01L21/28;H01L21/31;H01L21/3205 |
主分类号 |
H01L21/768 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|