发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device according to the embodiment of the present invention includes the steps of: forming a first wire layer to expose a first conductive layer and a first insulation layer from a surface; forming a second wire layer to expose a second conductive layer and a second insulation layer from the surface; forming a first non-bonding surface on the surface of the first insulation layer by forming a partial region of the surface of the first insulation layer including the surroundings of the first conductive layer to be lower than the surface of the first conductive layer; bonding the surface of the first conductive layer to the surface of the second conductive layer; and bonding the surface of the second insulation layer to the surface of the first insulation layer except the first non-bonding surface.
申请公布号 KR20150068284(A) 申请公布日期 2015.06.19
申请号 KR20140139847 申请日期 2014.10.16
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAWASAKI ATSUKO
分类号 H01L21/768;H01L21/28;H01L21/31;H01L21/3205 主分类号 H01L21/768
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