发明名称 |
MEMORIES HAVING A BUILT-IN SELF-TEST (BIST) FEATURE |
摘要 |
A memory system includes a memory and a built-in self-test (BIST) unit coupled to the memory. The BIST unit is configured to run a test pattern on the memory to accumulate a fault signature, and store fault signature information based on the accumulated fault signature at multiple locations in the memory. |
申请公布号 |
US2015162098(A1) |
申请公布日期 |
2015.06.11 |
申请号 |
US201314102727 |
申请日期 |
2013.12.11 |
申请人 |
SPRUTH HENNING F.;Qureshi Qadeer A.;Silveira Reinaldo |
发明人 |
SPRUTH HENNING F.;Qureshi Qadeer A.;Silveira Reinaldo |
分类号 |
G11C29/38;G06F11/263 |
主分类号 |
G11C29/38 |
代理机构 |
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代理人 |
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主权项 |
1. A memory system, comprising:
a memory; and a built-in self-test (BIST) unit coupled to the memory, wherein the BIST unit is configured to:
run a test pattern on the memory to accumulate a fault signature; andstore fault signature information based on the accumulated fault signature at multiple locations in the memory. |
地址 |
Austin TX US |