发明名称 Semiconductor device and method for manufacturing the same
摘要 The present disclosure provides a semiconductor device, including a semiconductor substrate, an epitaxial structure, a well region, a drain region and a source region respectively formed in the epitaxial structure inside and outside of the well region. At least one set of first, second and third heavily doped regions formed in the well region between source and drain regions, wherein the first, second and third heavily doped regions are adjoined sequentially from bottom to top. A gate structure disposed over the epitaxial structure. The present disclosure also provides a method for manufacturing the semiconductor device.
申请公布号 US9054129(B1) 申请公布日期 2015.06.09
申请号 US201414225943 申请日期 2014.03.26
申请人 Vanguard International Semiconductor Corporation 发明人 Tu Shang-Hui;Huang Chih-Jen;Chang Jui-Chun;Ho Yu-Hao;Lin Wen-Hsin;Lin Shin-Cheng
分类号 H01L23/62;H01L29/66 主分类号 H01L23/62
代理机构 Birch Stewart Kolasch & Birch, LLP 代理人 Birch Stewart Kolasch & Birch, LLP
主权项 1. A semiconductor device, comprising: a semiconductor substrate having a first conductivity type; an epitaxial structure of the first conductivity type disposed over the semiconductor substrate; a well region of a second conductivity type formed in the epitaxial structure and the semiconductor substrate, wherein the second conductivity type is opposite to the first conductivity type; a drain region and a source region respectively formed in the epitaxial structure inside and outside of the well region; at least one set of first, second and third heavily doped regions formed in the well region between source and drain regions, wherein the first, second and third heavily doped regions are adjoined sequentially from bottom to top and the second heavily doped region has a doping concentration greater than that of the well region, and the first and third heavily doped regions have a doping concentration similar to that of the well region, wherein the second heavily doped region has the first conductivity type, while the first and third heavily doped regions have the second conductivity type; and a gate structure disposed over the epitaxial structure.
地址 Hsinchu TW