发明名称 Test apparatus
摘要 A test apparatus for a server includes a first connection unit coupled to a mother board of the server, a second connection unit coupled to a device under test, a data transmission unit, a processing unit, and a network unit. According to a selection signal, the data transmission unit switches one of data transmission modes to perform data transmission between the first connection unit and the second connection unit. The processing unit controls the data transmission unit to perform a first test program for the mother board through the first connection unit, or perform a second test program for the device under test through the first connection unit and the second connection unit. The network unit receives a control signal generated by an external apparatus, so that the external apparatus controls the processing unit to perform the first test program and the second test program through the network unit.
申请公布号 US9037909(B2) 申请公布日期 2015.05.19
申请号 US201313785245 申请日期 2013.03.05
申请人 INVENTEC (PUDONG) TECHNOLOGY CORPORATION;INVENTEC CORPORATION 发明人 Chin Chih-Jen;Lu Yu-Shu
分类号 G06F11/00;G06F11/273 主分类号 G06F11/00
代理机构 Morris, Manning & Martin, LLP 代理人 Xia, Esq. Tim Tingkang;Morris, Manning & Martin, LLP
主权项 1. A test apparatus configured for a server, the test apparatus comprising: a first connection unit configured for being coupled to a mother board of the server; a second connection unit configured for being coupled to a device under test; a data transmission unit coupled to the first connection unit and the second connection unit, and configured for switching one of a plurality of data transmission modes according to a selection signal, so as to transmit data between the first connection unit and the second connection unit according to the selected one of the plurality of data transmission modes; a processing unit coupled to the data transmission unit, and configured for controlling the data transmission unit, so as to execute a first test program for the mother board through the first connection unit, or execute a second test program for the device under test through the first connection unit and the second connection unit, so that the first connection unit and the second connection unit transmit the corresponding data; and a network unit coupled to the processing unit, and configured for being coupled to an external apparatus, wherein the network unit receives a control signal generated by the external apparatus, so that the external apparatus controls the processing unit to execute the first test program and the second test program through the network unit.
地址 Shanghai CN