发明名称 |
METAL-INSULATOR-METAL CAPACITOR STRUCTURE |
摘要 |
A capacitor structure in a semiconductor device includes a semiconductor substrate having a top surface and a bottom surface opposite the top surface, an isolation region having a top surface and a bottom surface, opposite the top surface, the bottom surface of the isolation region being disposed on the top surface of the semiconductor substrate. The capacitor structure also includes a gate terminal structure disposed on the top surface of the isolation region and a diffusion contact structure disposed on the top surface of the isolation region and arranged parallel to the gate terminal structure. In some aspects, the gate terminal structure is connected to a first contact node and the diffusion contact structure is connected to a second contact node, in which the first and second contact nodes form opposing nodes of the capacitor structure. |
申请公布号 |
US2015108557(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201314072723 |
申请日期 |
2013.11.05 |
申请人 |
Broadcom Corporation |
发明人 |
PONOTH Shom Surendran;PARK Changyok;SHIAU Guang-Jye;ITO Akira |
分类号 |
H01L27/08;H01L49/02 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
1. A capacitor structure in a semiconductor device, the capacitor structure comprising:
a semiconductor substrate having a top surface and a bottom surface opposite the top surface; an isolation region having a top surface and a bottom surface, opposite the top surface, the bottom surface of the isolation region being disposed adjacent to the top surface of the semiconductor substrate; a gate terminal structure disposed on the top surface of the isolation region; and a diffusion contact structure disposed on the top surface of the isolation region and arranged parallel to the gate terminal structure, wherein the gate terminal structure is connected to a first contact node and the diffusion contact structure is connected to a second contact node, wherein the first and second contact nodes form opposing nodes of the capacitor structure. |
地址 |
Irvine CA US |