发明名称 X-RAY DEVICE, X-RAY IRRADIATION METHOD, AND MANUFACTURING METHOD FOR STRUCTURE
摘要 Provided is an x-ray device capable of suppressing reduction in detection precision. The X-ray device irradiates x-rays on an object and detects X-rays that pass through the object. The X-ray device comprises: an X-ray source that emits X-rays; a stage that holds the object; a detection device that detects at least some of the x-rays that have been emitted from the X-ray source and have passed through the object; a chamber member that forms an internal space wherein the X-ray source, the stage, and the detection device are arranged; and a partitioning section that separates the internal space into a first space wherein the X-ray source is arranged and a second space wherein the detection device is arranged.
申请公布号 EP2765408(A4) 申请公布日期 2015.04.22
申请号 EP20120838048 申请日期 2012.10.03
申请人 NIKON CORPORATION 发明人 WATANABE, TAKASHI
分类号 G01N23/04 主分类号 G01N23/04
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