发明名称 SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING THE SAME, AND IMAGING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a technology that is advantageous for improving transfer efficiency of electric charge generated by photoelectric conversion.SOLUTION: A solid-state imaging device comprises: a first semiconductor region of a first conductivity type provided on a substrate by an epitaxial growth method so that an impurity concentration becomes lower from a lower side toward an upper side; a second semiconductor region of the first conductivity type provided on the first semiconductor region; and a third semiconductor region of a second conductivity type provided in the second semiconductor region so as to form PN junction with the second semiconductor region. The impurity concentration distribution of the second semiconductor region is adjusted by the ion implantation method.
申请公布号 JP2015076453(A) 申请公布日期 2015.04.20
申请号 JP20130210588 申请日期 2013.10.07
申请人 CANON INC 发明人 MORIYAMA TAKASHI;MINOWA MASAAKI;ICHIKAWA TAKESHI;OGAWA MASAHIRO
分类号 H01L27/146;H04N5/33;H04N5/369 主分类号 H01L27/146
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