发明名称 PROCEDE DE POLISSAGE CHIMICO-MECANIQUE D'UN SUBSTRAT AVEC UNE COMPOSITION DE POLISSAGE ADAPTEE POUR ACCROITRE L'ELIMINATION DE L'OXYDE DE SILICIUM
摘要 <p>A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises silicon oxide; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and a substance according to formula I wherein R1, R2 and R3 are each independently selected from a C1-4 alky group; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein the substance according to formula I included in the chemical mechanical polishing composition provides an enhanced silicon oxide removal rate and an improved polishing defectivity performance; and, wherein at least some of the silicon oxide is removed from the substrate.</p>
申请公布号 FR2958200(B1) 申请公布日期 2015.04.17
申请号 FR20110052169 申请日期 2011.03.16
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 GUO YI;LIU ZHENDONG;REDDY KANCHARLA-ARUN KUMAR;ZHANG GUANGYUN
分类号 B24B29/02 主分类号 B24B29/02
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